Raman spectroscopy measurements of interface effects in C60/copper-oxide/copper

Materials Research Society Symposium - Proceedings

Volumn 734, Issue , 2003, Pages 291-296

  Li, Y ^a   Rhee, J H ^a   Singh, D ^a   Sharma, S C ^a  

^a UNIVERSITY OF TEXAS AT ARLINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER OXIDES; EVAPORATION; INTERFACES (MATERIALS); RAMAN SPECTROSCOPY;

RAMAN-ACTIVE BANDS;

FULLERENES;

EID: 0038680308     PISSN: 02729172     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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