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Volumn 734, Issue , 2003, Pages 285-290

Temperature dependence of the electrical resistivity of polymerized C60 thin films

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; FULLERENES; POLYMERIZATION; RAMAN SPECTROSCOPY; SEMICONDUCTING SILICON; SINGLE CRYSTALS; ULTRAVIOLET RADIATION;

EID: 0037635389     PISSN: 02729172     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (12)
  • 6
    • 0038255155 scopus 로고    scopus 로고
    • eds. H. D. Hochheimer, B. Kuchta, P. K. Dorhout, anf J. L. Yarger, Kluwer Acad. Publ.
    • S. C. Sharma, B. Ha, J. H. Rhee, and Y. Li, in Frontiers of High Pressure Research II, eds. H. D. Hochheimer, B. Kuchta, P. K. Dorhout, anf J. L. Yarger, Kluwer Acad. Publ. 48 (2001), 493.
    • (2001) Frontiers of High Pressure Research II , vol.48 , pp. 493
    • Sharma, S.C.1    Ha, B.2    Rhee, J.H.3    Li, Y.4
  • 9
    • 85008469263 scopus 로고    scopus 로고
    • MER Corporation, Tucson, Arizona
    • MER Corporation, Tucson, Arizona.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.