Photoelectron spectroscopy measurements of the valence band structures of polymerized thin films of C60 and La0.1C60

Surface Science

Volumn 520, Issue 3, 2002, Pages 186-192

  Ha, B ^a   Rhee, J H ^a   Li, Y ^a   Singh, D ^a   Sharma, S C ^a  

^a UNIVERSITY OF TEXAS AT ARLINGTON   (United States)

Author keywords

Electron density, excitation spectra calculations; Fullerenes; Photoelectron spectroscopy; Raman scattering spectroscopy; X ray scattering, diffraction, and reflection

Indexed keywords

BAND STRUCTURE; BINDING ENERGY; CARRIER CONCENTRATION; ELECTROMAGNETIC WAVE REFLECTION; FERMI LEVEL; FULLERENES; PROBABILITY DENSITY FUNCTION; RAMAN SCATTERING; RAMAN SPECTROSCOPY; THIN FILMS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY SCATTERING;

RAMAN SCATTERING SPECTROSCOPY;

SURFACE STRUCTURE;

EID: 0037153661     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)02274-4     Document Type: Article

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