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Volumn 4889, Issue 1, 2002, Pages 457-468

MARS2: An advanced femtosecond laser mask repair tool

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; LASERS; LIGHT TRANSMISSION; PHASE SHIFT; THERMAL DIFFUSION;

EID: 0038642151     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.467388     Document Type: Conference Paper
Times cited : (22)

References (15)
  • 1
    • 0012702824 scopus 로고
    • Applications of focused ion beams
    • A. Wagner, "Applications of Focused Ion Beams", Nucl. Instr. and Methods, 218, 355 (1983).
    • (1983) Nucl. Instr. and Methods , vol.218 , pp. 355
    • Wagner, A.1
  • 3
    • 0034316887 scopus 로고    scopus 로고
    • Performance of multicusp plasma ion source for focused ion beam applications
    • L. Scipioni, D. Stewart, D. Ferranti, A. Saxonis, "Performance of Multicusp Plasma Ion Source for Focused Ion Beam Applications", J. Vac. Sci. Technol. B18, 3194 (2000)
    • (2000) J. Vac. Sci. Technol. , vol.B18 , pp. 3194
    • Scipioni, L.1    Stewart, D.2    Ferranti, D.3    Saxonis, A.4
  • 7
    • 0029548059 scopus 로고
    • Effect of laser mask repair induced residue and quartz damage in sub-half micron DUV wafer process
    • P. Yan, Q. Qian, J. McCall, J. Langston, Y. Ger, J. Cho, B. Hainsey, "Effect of Laser Mask Repair Induced Residue and Quartz Damage in sub-half micron DUV Wafer Process", SPIE, 2621, 158 (1995).
    • (1995) SPIE , vol.2621 , pp. 158
    • Yan, P.1    Qian, Q.2    McCall, J.3    Langston, J.4    Ger, Y.5    Cho, J.6    Hainsey, B.7
  • 8
    • 0031342186 scopus 로고    scopus 로고
    • Chemically enhanced FIB repair of opaque defects on chrome photomasks
    • J. D. Casey Jr., A. F. Doyle, D. K. Stewart, D. Ferranti, "Chemically Enhanced FIB Repair of Opaque Defects on Chrome Photomasks", SPIE 3096, 322 (1997).
    • (1997) SPIE , vol.3096 , pp. 322
    • Casey J.D., Jr.1    Doyle, A.F.2    Stewart, D.K.3    Ferranti, D.4
  • 9
    • 0024607615 scopus 로고
    • Focused ion beam repair of lithographic masks
    • A. Wagner and J.P. Levin, "Focused Ion Beam Repair of Lithographic Masks", Nucl. Instr. And Methods, B37/38, 224 (1989).
    • (1989) Nucl. Instr. And Methods , vol.B37-38 , pp. 224
    • Wagner, A.1    Levin, J.P.2
  • 12
    • 0030214563 scopus 로고    scopus 로고
    • Physical and material aspects in using visible laser pulses of nanosecond duration for ablation
    • C. Korner, R. Mayerhofer, M. Hartmann, H.W. Bergmann, "Physical and Material Aspects in Using Visible Laser Pulses of Nanosecond Duration for Ablation", Appl. Phys. A., 63,123 (1996).
    • (1996) Appl. Phys. A. , vol.63 , pp. 123
    • Korner, C.1    Mayerhofer, R.2    Hartmann, M.3    Bergmann, H.W.4
  • 14
    • 36449004926 scopus 로고
    • Thermophysical effects in laser processing of materials with picosecond and femtosecond pulses
    • P. P. Pronko, S. K. Dutta, D. Du, R. K. Singh, "Thermophysical Effects in Laser Processing of Materials with Picosecond and Femtosecond Pulses", J. Appl. Phys., 78, 6233 (1995).
    • (1995) J. Appl. Phys. , vol.78 , pp. 6233
    • Pronko, P.P.1    Dutta, S.K.2    Du, D.3    Singh, R.K.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.