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Journal of Applied Physics

Volumn 93, Issue 10 1, 2003, Pages 6229-6233

Microstructure of annealed magnetic tunnel junction by electron microscopy

(6) Xu, Q Y a Wang, Y G a Zhang, Z a You, B b Du, J b Hu, A b

a INSTITUTE OF PHYSICS (China)

b NANJING UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COBALT COMPOUNDS; MAGNETORESISTANCE; MICROSTRUCTURE; TRANSMISSION ELECTRON MICROSCOPY;

MAGNETIC TUNNEL JUNCTIONS (MTJ);

MAGNETIC DEVICES;

EID: 0038621700 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1567037 Document Type: Article

Times cited : (5)

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