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Volumn 248-249, Issue , 1997, Pages 163-166

Depth resolved oxygen analysis at the interfaces of Au-Al layers

Author keywords

Au Al Layers; Backscattering Spectroscopy; Interface Behaviour; Ion Beam Bombardment; Oxygen Analysis

Indexed keywords

ALUMINUM; GOLD; INTERDIFFUSION (SOLIDS); INTERFACES (MATERIALS); ION BEAMS; ION BOMBARDMENT; OXYGEN; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SUBSTRATES;

EID: 0030711432     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.248-249.163     Document Type: Article
Times cited : (8)

References (15)
  • 10
    • 4143080945 scopus 로고    scopus 로고
    • Trans. Tech Publications, accepted for publication
    • A. Markwitz and G. Demortier, Trans. Tech Publications, accepted for publication, 1997
    • (1997)
    • Markwitz, A.1    Demortier, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.