메뉴 건너뛰기




Volumn 358, Issue 1-2, 1997, Pages 59-63

Characterization of the interdiffusion in Au-Al layers by RBS

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0005840781     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160050345     Document Type: Article
Times cited : (10)

References (22)
  • 3
    • 6244284456 scopus 로고    scopus 로고
    • Elsevier Sequoia S. A., Lausanne, Switzerland
    • Journal of Thin Solid Films (Elsevier Sequoia S. A., Lausanne, Switzerland)
    • Journal of Thin Solid Films
  • 11
    • 84914199092 scopus 로고
    • M.H. Francombe and R.W. Hoffmann, Academic Press, New York
    • Weaver C (1971) Physics of Thin Films 6. ed. M.H. Francombe and R.W. Hoffmann, Academic Press, New York, p 301
    • (1971) Physics of Thin Films 6. Ed. , pp. 301
    • Weaver, C.1
  • 17
    • 25144453462 scopus 로고    scopus 로고
    • August 5-9, Nordkirchen, Germany, accepted for publication in a Defect and Diffusion Forum by Trans. Tech. Publications
    • Markwitz A, Demortier G, International Conference on Diffusion in Materials, August 5-9, 1996, Nordkirchen, Germany, accepted for publication in a Defect and Diffusion Forum by Trans. Tech. Publications (1997)
    • (1996) International Conference on Diffusion in Materials
    • Markwitz, A.1    Demortier, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.