Availability of layered certified reference materials for industrial application of glow discharge spectrometric depth profiling

Surface and Interface Analysis

Volumn 27, Issue 10, 1999, Pages 930-935

  Winchester, Michael R ^a   Beck, Uwe ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

MATERIALS SCIENCE; SPECTROMETRY;

CERTIFIED REFERENCE MATERIALS (CRM); DEPTH PROFILING; GLOW DISCHARGE SPECTROMETRY (GDS);

GLOW DISCHARGES;

EID: 0344672365     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199910)27:10<930::AID-SIA653>3.0.CO;2-D     Document Type: Article

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