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Volumn 1, Issue 1, 2002, Pages 70-77

Design and characterization of two-axis rotational micromirrors using multi-user microelectromechanical system processes

Author keywords

Electrostatic actuation; MEMS; Mirau interferometry; Rotational micromirror; Surface micromachining

Indexed keywords


EID: 0038593616     PISSN: 15371646     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1445799     Document Type: Article
Times cited : (3)

References (13)
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  • 4
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    • April
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    • Smith, J.H.1
  • 5
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    • Multi-Project Chip Activities Demonstrate Enormous Potential of Surface Micromachining
    • Internal Newsletter, Analog Devices Inc., Micromachined Products Division, One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106
    • R. S. Payne, "Multi-Project Chip Activities Demonstrate Enormous Potential of Surface Micromachining," Acceterometer News, Internal Newsletter, Analog Devices Inc., Micromachined Products Division, One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106.
    • Acceterometer News
    • Payne, R.S.1
  • 6
    • 0003945225 scopus 로고    scopus 로고
    • Revision 4, Cronos Integrated Microsystems, 3021 Cornwallis Road, Research Triangle Park, NC 27709, May
    • D. A. Koester, R. Mahadevan, A. Shishkoff, and K. W. Markus, MUMPs Design Handbook, Revision 4, Cronos Integrated Microsystems, 3021 Cornwallis Road, Research Triangle Park, NC 27709 (May 1999).
    • (1999) MUMPs Design Handbook
    • Koester, D.A.1    Mahadevan, R.2    Shishkoff, A.3    Markus, K.W.4
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    • Electrostatic Micro Torsion Mirrors for an Optical Switch Matrix
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    • Toshiyoshi, H.1    Fujita, H.2
  • 10
    • 0031236953 scopus 로고    scopus 로고
    • A New Technique for Measuring the Mechanical Properties of Thin Films
    • W. N. Sharpe, Jr., B. Yuan, and R. L. Edwards, "A New Technique for Measuring the Mechanical Properties of Thin Films," J. Microeleclromech. Sysi. 6(3), 193-199 (1997).
    • (1997) J. Microelectromech. Syst. , vol.6 , Issue.3 , pp. 193-199
    • Sharpe, Jr.W.N.1    Yuan, B.2    Edwards, R.L.3
  • 13
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    • Extended averaging technique for derivation of error-compensating algorithms in phase-shifting interferometry
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    • (1995) Appl. Opt. , vol.34 , pp. 3610-3619
    • Schmit, J.1    Creath, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.