Experimental characterization of correlation-functions of random surfaces by speckle measurement and complementary algorithm

Chinese Physics Letters

Volumn 20, Issue 5, 2003, Pages 664-667

  Cheng, Chuan Fu ^a,b   Liu, Man ^a,b   Teng, Shu Yun ^a   Song, Hong Sheng ^b   Chen, Jian Ping ^a   Xu, Zhi Zhan ^a  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

^b SHANDONG NORMAL UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; EXPONENTIAL FUNCTIONS;

AVERAGE IMAGE; BESSEL'S FUNCTION; CORRELATION FUNCTION; EXPERIMENTAL CHARACTERIZATION; FOURIER-BESSEL TRANSFORMS; FUNCTION FACTOR; HEIGHT-HEIGHT CORRELATION FUNCTIONS; INTENSITY DATA; RANDOM SURFACES; SPECKLE INTENSITY;

SPECKLE;

EID: 0038587501     PISSN: 0256307X     EISSN: None     Source Type: Journal    
DOI: 10.1088/0256-307X/20/5/321     Document Type: Article

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