SCOPUS 정보 검색 플랫폼

Chinese Physics Letters

Volumn 19, Issue 9, 2002, Pages 1283-1286

Measurement of random surface parameters of weak scatterers using the speckle contrast method

(6) Cheng, Chuan Fu a,b Liu, Chun Xiang b Teng, Shu Yun a Zhang, Ning Yu c Li, Ru Xin a Xu, Zhi Zhan a

a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS (China)

b SHANDONG NORMAL UNIVERSITY (China)

c SHANDONG JIANZHU UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

4F-SYSTEM; IMAGE PLANE; LATERAL CORRELATION LENGTH; MEASUREMENTS OF; PROPERTY; RANDOM SURFACES; SCATTERING OBJECTS; SPECKLE CONTRASTS; SURFACE PARAMETER; WEAK SCATTERING;

EID: 0036713451 PISSN: 0256307X EISSN: None Source Type: Journal
DOI: 10.1088/0256-307X/19/9/320 Document Type: Article

Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.