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Volumn 38, Issue 11, 1999, Pages 2212-2215

Simple model for image-plane polychromatic speckle contrast

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; COHERENT LIGHT; COMPUTATIONAL GEOMETRY; ERROR ANALYSIS; IMAGE ANALYSIS; IMAGE QUALITY; IMAGE SENSORS; INTEGRAL EQUATIONS; MATHEMATICAL MODELS; OPTICAL CORRELATION;

EID: 0032614163     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.002212     Document Type: Article
Times cited : (23)

References (11)
  • 1
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    • R. G. Dorsch, G. Hausler, and J. M. Herrmann, “Laser triangulation: fundamental uncertainty in distance measure ment,” Appl. Opt. 33, 1306-1314 (1994).
    • (1994) Appl. Opt , vol.33 , pp. 1306-1314
    • Dorsch, R.G.1    Hausler, G.2    Herrmann, J.M.3
  • 3
    • 0015483922 scopus 로고
    • Surface roughness measurement using white light speckle
    • R. A. Sprague, “Surface roughness measurement using white light speckle,” Appl. Opt. 11, 2811-2816 (1972).
    • (1972) Appl. Opt. , vol.11 , pp. 2811-2816
    • Sprague, R.A.1
  • 4
    • 0042427181 scopus 로고
    • Average contrast of white-light image speckle patterns
    • K. Nakagawa and T. Asakura, “Average contrast of white-light image speckle patterns,” Opt. Acta 26, 951-960 (1979).
    • (1979) Opt. Acta , vol.26 , pp. 951-960
    • Nakagawa, K.1    Asakura, T.2
  • 5
    • 0344524386 scopus 로고
    • Contrast of white light speckle patterns at a defocused image plane
    • K. Nakagawa and T. Asakura, “Contrast of white light speckle patterns at a defocused image plane,” Appl. Opt. 18, 3725-3728 (1979).
    • (1979) Appl. Opt. , vol.18 , pp. 3725-3728
    • Nakagawa, K.1    Asakura, T.2
  • 6
    • 0001859457 scopus 로고
    • On the contrast of polychromatic speckle patterns and its dependence on surface roughness
    • H. M. Pedersen, “On the contrast of polychromatic speckle patterns and its dependence on surface roughness,” Opt. Acta 22, 15-24 (1975).
    • (1975) Opt. Acta , vol.22 , pp. 15-24
    • Pedersen, H.M.1
  • 7
    • 0009480950 scopus 로고
    • Second-order statistics of light diffracted from Gaussian, rough surfaces with applications to the roughness dependence of speckles
    • H. M. Pedersen, “Second-order statistics of light diffracted from Gaussian, rough surfaces with applications to the roughness dependence of speckles,” Opt. Acta 22, 523-535 (1975).
    • (1975) Opt. Acta , vol.22 , pp. 523-535
    • Pedersen, H.M.1
  • 8
    • 0003243055 scopus 로고
    • Speckle patterns in partially coherent light
    • 2nd ed., J. C. Dainty, ed, of Topics in Applied Physics (Springer-Verlag, Berlin, Chap. 3
    • G. Parry, “Speckle patterns in partially coherent light,” Laser Speckle and Related Phenomena, 2nd ed., J. C. Dainty, ed., Vol. 9 of Topics in Applied Physics (Springer-Verlag, Berlin, 1984), Chap. 3.
    • (1984) Laser Speckle and Related Phenomena , vol.9
    • Parry, G.1
  • 9
    • 0016907998 scopus 로고
    • Image-plane speckle in partially coherent illumination
    • T. S. McKechnie, “Image-plane speckle in partially coherent illumination,” Opt. Quantum Electron. 8, 61-67 (1976).
    • (1976) Opt. Quantum Electron. , vol.8 , pp. 61-67
    • Mc Kechnie, T.S.1
  • 10
    • 0028440845 scopus 로고
    • Dependence of polychromatic-speckle-pattern contrast on imaging and illumination directions
    • Y.-Q. Hu, “Dependence of polychromatic-speckle-pattern contrast on imaging and illumination directions,” Appl. Opt. 33, 2707-2714 (1994).
    • (1994) Appl. Opt. , vol.33 , pp. 2707-2714
    • Hu, Y.-Q.1
  • 11
    • 0002068881 scopus 로고
    • Statistical properties of laser speckle patterns
    • 2nd ed., J. C. Dainty, ed., Topics in Applied Physics (Springer-Verlag, Berlin, Chap. 2
    • J. W. Goodman, “Statistical properties of laser speckle patterns,” Laser Speckle and Related Phenomena, 2nd ed., J. C. Dainty, ed., Vol. 9 of Topics in Applied Physics (Springer-Verlag, Berlin, 1984), Chap. 2.
    • (1984) Laser Speckle and Related Phenomena , vol.9
    • Goodman, J.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.