Nonlinear measures for characterizing rough surface morphologies

Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

Volumn 61, Issue 1, 2000, Pages 104-125

  Kondev, Jané ^a,b   Henley, Christopher L ^c   Salinas, David G ^c  

^a INSTITUTE FOR ADVANCED STUDY   (United States)

^b PRINCETON UNIVERSITY   (United States)

^c Laboratory of Atomic and Solid State Physics and Sibley School of Mechanical and Aerospace Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; FRACTAL DIMENSION; LAMINATES; MORPHOLOGY;

COMPUTER GENERATED; CORRELATION LENGTHS; INDEPENDENT MEASUREMENT; ROUGHNESS EXPONENT; SCALING PROPERTIES; SCANNING TUNNELING MICROSCOPES; SELF-AFFINE SCALING; SELF-AFFINE SURFACES;

SURFACE MEASUREMENT;

EID: 0001472854     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.61.104     Document Type: Article

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