Light induced changes in the defect structure of a-Si:H

Thin Solid Films

Volumn 430, Issue 1-2, 2003, Pages 149-152

  Britton, D T ^a   Sigcau, Z ^a   Comrie, C M ^a   Kanguwe, D F ^a   Minani, E ^a   Knoesen, D ^b   Harting M ^a  

^a UNIVERSITY OF CAPE TOWN   (South Africa)

^b UNIVERSITY OF THE WESTERN CAPE   (South Africa)

Author keywords

Light induced degredation; Positron annihilation; Structural defects; Structural relaxation

Indexed keywords

ANNEALING; CHEMICAL VAPOR DEPOSITION; CRYSTALLIZATION; X RAY DIFFRACTION ANALYSIS;

ELECTRON MOMENTUM SPECTROSCOPY;

AMORPHOUS SILICON;

EID: 0038527224     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00103-2     Document Type: Conference Paper

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