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Volumn 63, Issue 19, 2001, Pages

Thickness-dependent valence-band photoemission from thin InAs and GaAs films

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; FILM; GEOMETRY; MOLECULAR DYNAMICS; MOLECULAR PHYSICS; SPECTROSCOPY; THICKNESS;

EID: 0038489778     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.63.195314     Document Type: Article
Times cited : (11)

References (21)
  • 20
    • 0003425106 scopus 로고    scopus 로고
    • 2nd ed., Vol. 26 of Springer Series in Surface Science (Springer, Berlin, 1995), p. 9, and references therein
    • W. Mönch, Semiconductor Surfaces and Interfaces, 2nd ed., Vol. 26 of Springer Series in Surface Science (Springer, Berlin, 1995), p. 9, and references therein.
    • Semiconductor Surfaces and Interfaces
    • Mönch, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.