Kinetic roughening of Si surfaces and surfactant effect in low temperature molecular beam epitaxy growth

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 16, Issue 3, 1998, Pages 1564-1567

  Gallas, B ^a   Berbezier, I ^a   Derrien, J ^a   Gandolfo, D ^b   Ruiz, J ^b   Zagrebnov, V A ^b  

^a AIX MARSEILLE UNIVERSITÉ   (France)

^b CENTRE DE PHYSIQUE THÉORIQUE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038406566     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589940     Document Type: Article

References (22)

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