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Volumn 3449, Issue , 1998, Pages 80-90

The scanning microscopy end-station at the ESRF X-ray microscopy beamline

Author keywords

Spectromicroscopy; X ray microscopy

Indexed keywords

FLUORESCENCE; FOCUSING; IMAGING SYSTEMS; MIRRORS; MONOCHROMATORS; MULTILAYERS; OPTICAL DESIGN; OPTICAL DEVICES; OPTICAL RESOLVING POWER; PHOTONS; SCANNING; X RAY OPTICS; X RAY SPECTROSCOPY;

EID: 0032225270     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.330335     Document Type: Conference Paper
Times cited : (14)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.