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Volumn 31, Issue 1, 2002, Pages 66-70
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Nanoindentation and orientation imaging: Probing small volumes and thin films for mechanical properties
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Author keywords
AFM; Hardness; OIM
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
INDENTATION;
MECHANICAL PROPERTIES;
MOLECULAR ORIENTATION;
NANOTECHNOLOGY;
THIN FILMS;
DEPTH MONITORING;
HYDROGEN-CONTAINING ATMOSPHERES;
NANOINDENTATION;
ORIENTATION IMAGING MICROSCOPY (OIM);
IMAGING TECHNIQUES;
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EID: 0038209752
PISSN: 03615235
EISSN: None
Source Type: Journal
DOI: 10.1007/s11664-002-0174-8 Document Type: Article |
Times cited : (10)
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References (19)
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