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Volumn 31, Issue 1, 2002, Pages 66-70

Nanoindentation and orientation imaging: Probing small volumes and thin films for mechanical properties

Author keywords

AFM; Hardness; OIM

Indexed keywords

ATOMIC FORCE MICROSCOPY; INDENTATION; MECHANICAL PROPERTIES; MOLECULAR ORIENTATION; NANOTECHNOLOGY; THIN FILMS;

EID: 0038209752     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-002-0174-8     Document Type: Article
Times cited : (10)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.