Application of atomic stereomicroscope to surface science

Progress in Surface Science

Volumn 71, Issue 5-8 SPEC, 2003, Pages 217-239

  Nakatani, Takeshi ^a   Matsushita, Tomohiro ^b   Miyatake, Yutaka ^c   Nohno, Tomohito ^c   Kobayashi, Atsushi ^c   Fukumoto, Keiki ^c   Okamoto, Shunsuke ^c   Nakamoto, Azusa ^c   Matsui, Fumihiko ^c   Hattori, Ken ^c   Kotsugi, Masato ^d   Saitoh, Yuji ^a   Suga, Shigemasa ^d   Daimon, Hiroshi ^c  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^c NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^d OSAKA UNIVERSITY   (Japan)

Author keywords

Circular dichroism; Display type spherical mirror analyzer; Photoelectron angular distribution; Stereo view; Stereomicroscope; Structure analysis

Indexed keywords

FOURIER TRANSFORMS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; STRUCTURE (COMPOSITION); X RAY DIFFRACTION ANALYSIS;

CIRCULAR DICHROISM;

SURFACE CHEMISTRY;

EID: 0038177963     PISSN: 00796816     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0079-6816(03)00008-X     Document Type: Conference Paper

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