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Surface Review and Letters

Volumn 6, Issue 5, 1999, Pages 585-590

Measurements of auger electron diffraction using a 180° deflection toroidal analyzer

(4) Shiraki, Susumu a Ishii, Hideshi a Nihei, Yoshimasa a Owari, Masanori b

a INSTITUTE OF INDUSTRIAL SCIENCE (Japan)

b UNIVERSITY OF TOKYO (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033272153 PISSN: 0218625X EISSN: None Source Type: Journal
DOI: 10.1142/S0218625X99000536 Document Type: Article

Times cited : (9)

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