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Volumn , Issue , 2003, Pages 678-681
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Mechanical properties of compressively prestressed thin films extracted from pressure dependent ripple profiles of long membranes
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Author keywords
[No Author keywords available]
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Indexed keywords
BUCKLING;
COMPRESSIVE STRESS;
COMPUTER SIMULATION;
ELASTIC MODULI;
MATHEMATICAL MODELS;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
SILICON NITRIDE;
STRAIN;
THIN FILMS;
COMPRESSIVELY PRESTRESSED THIN FILM;
ENERGY MINIMIZATION METHOD;
PRESTRAIN;
MICROELECTROMECHANICAL DEVICES;
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EID: 0038155442
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (16)
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References (7)
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