Second-harmonic microscopy - a new tool for the remote sensing of interfaces

Physica Status Solidi (A) Applied Research

Volumn 173, Issue 1, 1999, Pages 15-27

  Florsheimer M ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES; INFRARED SPECTROSCOPY; OPTICAL MICROSCOPY; OPTICAL VARIABLES MEASUREMENT; REMOTE SENSING; SECOND HARMONIC GENERATION;

QUANTITATIVE IN SITU INVESTIGATION; SECOND HARMONIC MICROSCOPY; SECOND ORDER OPTICAL SUSCEPTIBILITY; SPATIAL RESOLUTION LIMIT; SUM FREQUENCY IMAGING; VISIBLE LIGHT MICROSCOPE;

INTERFACES (MATERIALS);

EID: 0038106081     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199905)173:1<15::AID-PSSA15>3.0.CO;2-8     Document Type: Article

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