Second-harmonic imaging of surface order and symmetry

Thin Solid Films

Volumn 327-329, Issue 1-2, 1998, Pages 241-246

  Flörsheimer, Mathias ^a   Bösch, Martin ^a,b   Brillert, Christof ^a   Wierschem, Maria ^a   Fuchs, Harald ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

^b ETH ZURICH   (Switzerland)

Author keywords

Interface sensitivity; Noncollinear geometry; Second harmonic microscopy; Sum frequency microscopy; Surface order; Surface symmetry

Indexed keywords

GEOMETRICAL OPTICS; INTERFACES (MATERIALS); OPTICAL MICROSCOPY; REMOTE SENSING; SECOND HARMONIC GENERATION; TENSORS;

NONCOLLINEAR GEOMETRY; SECOND HARMONIC MICROSCOPY; SUM-FREQUENCY MICROSCOPY;

OPTICAL FILMS;

EID: 0032136565     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)00637-3     Document Type: Article

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