Second-harmonic microscopy-A quantitative probe for molecular surface order

Advanced Materials

Volumn 9, Issue 13, 1997, Pages 1061-1065

  Flörsheimer, Mathias ^a   Bösch, Martin ^a,b   Brillert, Christof ^a   Wierschem, Maria ^a   Fuchs, Harald ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

^b ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACES (MATERIALS); MOLECULAR ORIENTATION; REMOTE SENSING; SECOND HARMONIC GENERATION;

SECOND HARMONIC MICROSCOPY;

MICROSCOPIC EXAMINATION;

EID: 0031551637     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.19970091315     Document Type: Article

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