Refractive index and thickness determination of monolayers by multi mode waveguide coupled surface plasmons

Sensors and Actuators, B: Chemical

Volumn 56, Issue 3, 1999, Pages 189-197

  Weisser, Michael ^a   Menges, Bernhard ^a   Mittler Neher, Silvia ^a  

^a MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT POLARIZATION; LIGHT PROPAGATION; MONOLAYERS; REFRACTIVE INDEX; WAVEGUIDE COUPLERS;

MULTIMODE WAVEGUIDES; SURFACE PLASMONS;

OPTICAL WAVEGUIDES;

EID: 0033138370     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-4005(99)00034-9     Document Type: Article

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