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Volumn 4983, Issue , 2003, Pages 34-43

Integrated optical monitoring of MEMS for closed-loop control

Author keywords

Diffractive optics; Fault tolerance; Integrated optical moitoring; Linear control; MEMS

Indexed keywords

CLOSED LOOP CONTROL SYSTEMS; COMPUTER SIMULATION; DIFFRACTIVE OPTICS; FABRICATION; FAILURE ANALYSIS; FAULT TOLERANT COMPUTER SYSTEMS; FEEDBACK; INTEGRATED OPTICS; LINEAR CONTROL SYSTEMS; MEASUREMENTS; OPTICAL DEVICES; OSCILLATORS (ELECTRONIC); ROBUSTNESS (CONTROL SYSTEMS);

EID: 0038058809     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (14)
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  • 4
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    • Optical methods for characterization of MEMS device motion
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    • Nelson, P.R.1    Chu, P.B.2    Pister, K.S.J.3
  • 5
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    • Ultrafine motion detection of micromechanical structures using optical Moire Pattern
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    • (1996) IEEE Photonics Technology Letters , vol.8 , Issue.8
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  • 6
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    • Garcia1
  • 7
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    • Through-wafer optical probe characterization for MEMS positional state monitoring and feedback control
    • J. Dawson, J. Chen, K. Brown, P. Famouri, and L. A. Hornak, "Through-wafer Optical Probe Characterization for MEMS Positional State Monitoring and Feedback Control," J. of Optical Engineering, Vol. 39(12), pp. 3239-3246 (2000).
    • (2000) J. of Optical Engineering , vol.39 , Issue.12 , pp. 3239-3246
    • Dawson, J.1    Chen, J.2    Brown, K.3    Famouri, P.4    Hornak, L.A.5
  • 8
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    • L.A. Hornak, P. Famouri, J.M. Dawson, and L. Wang, "MOEMS Integrated Optical Monitoring," Proc. SPIE, Vol. 4561, pp. 221-230, Oct. 2001.
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  • 11
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    • Microfabricated actuators and their application to optics
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    • SPIE , vol.2383 , pp. 46-64
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.