-
1
-
-
0038505995
-
-
[Online]
-
[Online]. http://hpc.jpl.nasa.gov/PEP/gekco/nemo/.
-
-
-
-
2
-
-
0033321196
-
Quantum transport modeling of ultrasmall semiconductor devices
-
H. Tsuchiya and T. Miyoshi, "Quantum transport modeling of ultrasmall semiconductor devices," IEICE Trans. Electron., vol. E82-C, no. 6, pp. 880-887, 1999.
-
(1999)
IEICE Trans. Electron.
, vol.E82-C
, Issue.6
, pp. 880-887
-
-
Tsuchiya, H.1
Miyoshi, T.2
-
3
-
-
0033749512
-
The onset of quantization in ultra-submicron semiconductor devices
-
D. K. Ferry, "The onset of quantization in ultra-submicron semiconductor devices," Superlatt. Microstruct., vol. 27, no. 2/3, pp. 61-66, 2000.
-
(2000)
Superlatt. Microstruct.
, vol.27
, Issue.2-3
, pp. 61-66
-
-
Ferry, D.K.1
-
4
-
-
0029752460
-
A computationally efficient model for inversion layer quantization effects in deep submicron N-channel MOSFET's
-
Jan.
-
S. A. Hareland, S. Krishnamurthy, S. Jallepalli, C.-F. Yeap, K. Hasnat, A. F. Tasch, and C. M. Maziar, "A computationally efficient model for inversion layer quantization effects in deep submicron N-channel MOSFET's," IEEE Trans. Electron Devices, vol. 43, pp. 90-96, Jan. 1996.
-
(1996)
IEEE Trans. Electron Devices
, vol.43
, pp. 90-96
-
-
Hareland, S.A.1
Krishnamurthy, S.2
Jallepalli, S.3
Yeap, C.-F.4
Hasnat, K.5
Tasch, A.F.6
Maziar, C.M.7
-
5
-
-
0032098559
-
Self-consistent 2-D model for quantum effects in n-MOS transistors
-
Jan.
-
A. S. Spinelli, A. Benvenuti, and A. Pacelli, "Self-consistent 2-D model for quantum effects in n-MOS transistors," IEEE Trans. Electron Devices, vol. 45, pp. 1342-1349, Jan. 1998.
-
(1998)
IEEE Trans. Electron Devices
, vol.45
, pp. 1342-1349
-
-
Spinelli, A.S.1
Benvenuti, A.2
Pacelli, A.3
-
6
-
-
0000135289
-
Full-band Monte Carlo investigation of hot carrier trends in the scaling of metal-oxide-semiconductor field-effect transistors
-
A. Duncan, U. Ravaioli, and J. Jakumeit, "Full-band Monte Carlo investigation of hot carrier trends in the scaling of metal-oxide-semiconductor field-effect transistors," IEEE Trans. Electron Devices, vol. 45, pp. 867-876, 1998.
-
(1998)
IEEE Trans. Electron Devices
, vol.45
, pp. 867-876
-
-
Duncan, A.1
Ravaioli, U.2
Jakumeit, J.3
-
9
-
-
0000546326
-
Quasithree-dimensional Green's function simulation of coupled electron waveguides
-
M. Macucci, A. T. Galick, and U. Ravaioli, "Quasithree-dimensional Green's function simulation of coupled electron waveguides," Phys. Rev. B, vol. 52, pp. 5210-5220, 1995.
-
(1995)
Phys. Rev. B
, vol.52
, pp. 5210-5220
-
-
Macucci, M.1
Galick, A.T.2
Ravaioli, U.3
-
10
-
-
0004161838
-
-
Cambridge, U.K.: Cambridge Univ. Press
-
W. Press, S. Teukolsky, W. Vetterling, and B. Flannery, Numerical Recipes in Fortran 77, 2nd ed. Cambridge, U.K.: Cambridge Univ. Press, 1992.
-
(1992)
Numerical Recipes in Fortran, 2nd Ed.
, vol.77
-
-
Press, W.1
Teukolsky, S.2
Vetterling, W.3
Flannery, B.4
-
11
-
-
0348239733
-
Study of interface roughness dependence of electron mobility in Si inversion layers using the Monte Carlo method
-
S. Yamakawa, H. Ueno, K. Taniguchi, C. Hamaguchi, K. Miyatsuji, K. Masaki, and U. Ravaioli, "Study of interface roughness dependence of electron mobility in Si inversion layers using the Monte Carlo method," J. Appl. Phys., vol. 79, no. 2, pp. 911-916, 1996.
-
(1996)
J. Appl. Phys.
, vol.79
, Issue.2
, pp. 911-916
-
-
Yamakawa, S.1
Ueno, H.2
Taniguchi, K.3
Hamaguchi, C.4
Miyatsuji, K.5
Masaki, K.6
Ravaioli, U.7
-
12
-
-
0001275769
-
-
S. M. Goodnick, D. K. Ferry, C. W. Wilmsen, Z. Liliental, D. Fathy, and O. L. Krivanek, Phys. Rev. B, vol. 32, p. 8171, 1985.
-
(1985)
Phys. Rev. B
, vol.32
, pp. 8171
-
-
Goodnick, S.M.1
Ferry, D.K.2
Wilmsen, C.W.3
Liliental, Z.4
Fathy, D.5
Krivanek, O.L.6
-
13
-
-
0028747841
-
On the universality of inversion layer mobility in Si MOSFET's
-
Dec.
-
S. Takagi, A. Toriumu, M. Iwase, and H. Tango, "On the universality of inversion layer mobility in Si MOSFET's," IEEE Trans. Electron Devices, vol. 41, pp. 2357-2368, Dec. 1994.
-
(1994)
IEEE Trans. Electron Devices
, vol.41
, pp. 2357-2368
-
-
Takagi, S.1
Toriumu, A.2
Iwase, M.3
Tango, H.4
-
14
-
-
0020717155
-
2 interface as determined by a time-of-flight technique
-
2 interface as determined by a time-of-flight technique," J. Appl. Phys., vol. 54, no. 3, pp. 1445-1456, 1983.
-
(1983)
J. Appl. Phys.
, vol.54
, Issue.3
, pp. 1445-1456
-
-
Cooper J.A., Jr.1
Nelson, D.F.2
|