High-resolution second-harmonic microscopy of poled silica waveguides

Optics Communications

Volumn 221, Issue 4-6, 2003, Pages 295-300

  Beermann, Jonas ^a   Bozhevolnyi, Sergey I ^a   Pedersen, Kjeld ^a   Fage Pedersen, Jacob ^b  

^a AALBORG UNIVERSITY   (Denmark)

^b TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Scanning optical microscopy; Second harmonic generation

Indexed keywords

ELECTRIC FIELDS; LIGHT POLARIZATION; LIGHT REFLECTION; OPTICAL MICROSCOPY; SECOND HARMONIC GENERATION; SEMICONDUCTING GALLIUM ARSENIDE; SILICA;

SPATIAL RESOLUTION;

OPTICAL WAVEGUIDES;

EID: 0038044637     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(03)01426-3     Document Type: Article

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