Reflection second-harmonic microscopy of individual semiconductor microstructures

Journal of Applied Physics

Volumn 90, Issue 12, 2001, Pages 6357-6362

  Bozhevolnyi, Sergey I ^a   Maidykovski, Anton ^a   Vohnsen, Brian ^a   Zwiller, Valéry ^b  

^a AALBORG UNIVERSITY   (Denmark)

^b LUND UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035894031     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1415536     Document Type: Article

References (19)

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