Structural and optical properties of epitaxial CuGaS2 films on Si substrates

Thin Solid Films

Volumn 431-432, Issue , 2003, Pages 219-222

  Metzner, H ^a   Cieslak, J ^a   Grossner, U ^a   Hahn, Th ^a   Kaiser, U ^a   Krausslich J ^a   Reislohner U ^a   Witthuhn, W ^a   Goldhahn, R ^b   Eberhardt, J ^b  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^b ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

CuGaS2; Molecular beam epitaxy; Photoreflectance; Rutherford backscattering; Transmission electron microscopy; X ray diffraction

Indexed keywords

ENERGY GAP; FILM GROWTH; MOLECULAR BEAM EPITAXY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SINGLE CRYSTALS; TERNARY SYSTEMS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

PHOTOREFLECTANCE;

COPPER COMPOUNDS;

EID: 0038018538     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00227-X     Document Type: Conference Paper

References (14)

1. W. Fuhs, R. klenk, in: J. Schmid, H.A. Ossenbrink, P. Helm, H. Ehmann, E.D. Dunlop (Eds.)Proceedings of the Second World Conference on Photovoltaic Energy Conversion, E.C. Joint Research Centre, Luxembourg, 1998, pp. 381-386.
2. Contreras M.A., Egaas B., Ramanathan K., Hiltner J., Swartzlander A., Hason F., Noufi R. Prog. Phot. Res. Appl. 7:1999;311.
3. J. Klaer, J. Bruns, R. Henninger, K. Töpper, R. Klenk, K. Ellmer, D. Bräunig, in: J. Schmid, H.A. Ossenbrink, P. Helm, H. Ehmann, E.D. Dunlop (Eds.) Proceedings of the Second World Conference on Photovoltaic Energy Conversion, E.C. Joint Research Centre, Luxembourg, 1998, pp. 537-540.
4. Metzner H., Hahn Th., Bremer J.-H., Conrad J. Appl. Phys. Lett. 69:1996;1900.
5. Hahn Th., Metzner H., Plikat B., Seibt M. Appl. Phys. Lett. 72:1998;2733.
6. Hunger R., Scheer R., Diesner K., Su D., Lewerenz H.J. Appl. Phys. Lett. 69:1996;3010.
7. Su D.S., Neumann W., Hunger R., Schubert-Bischoff P., Giersig M., Lewerenz H.J., Scheer R., Zeitler E. Appl. Phys. Lett. 73:1998;785.
8. Shirakata S., Chichibu S. J. Appl. Phys. 87:2000;3793. and references cited therein.
9. Metzner H., Hahn Th., Cieslak J., Grossner U., Reislöhner U., Witthuhn W., Goldhahn R., Eberhardt J., Gobsch G., Kräußlich J. Appl. Phys. Lett. 81:2002;156.
10. Gossla M., Hahn Th., Metzner H., Conrad J., Geyer U. Thin Solid Films. 268:1995;39.
11. Metzner H., Hahn Th. J. Crystal Growth. 225:2001;354.
12. Abrahams S.C., Bernstein J.L. J. Chem. Phys. 59:1973;5415.
13. Shirakata S., Isomura S. J. Appl. Phys. 70:1991;7051.
14. Shirakata S., Chichibu S. J. Appl. Phys. 79:1996;2043.