Experimental method for high-accuracy reflectivity-spectrum measurements

Applied Optics

Volumn 37, Issue 28, 1998, Pages 6671-6676

  Berseth, Claude Albert ^a   Schönberg, Arthur ^a,b   Dehaese, Oliver ^a   Leifer, Klaus ^a   Rudra, Alok ^a   Kapon, Eli ^a  

^a EPFL   (Switzerland)

^b SOREQ NUCLEAR RESEARCH CENTER   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038013233     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.006671     Document Type: Article

References (17)

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