Structural and optical characterization of InP/InGaAsP distributed Bragg reflectors grown by CBE

Conference Proceedings - International Conference on Indium Phosphide and Related Materials

Volumn , Issue , 1997, Pages 428-431

  Behrend, J ^a   Rudra, A ^a   Sagalowicz, L ^a   Berseth, C A ^a   Carlin, J F ^a   Schoenberg, A ^a   Jouneau, P H ^a   Kapon, E ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL BEAM EPITAXY; CRYSTAL STRUCTURE; INTERFACES (MATERIALS); REFLECTOMETERS; SEMICONDUCTING INDIUM PHOSPHIDE; TRANSMISSION ELECTRON MICROSCOPY; X RAY CRYSTALLOGRAPHY;

DISTRIBUTED BRAGG REFLECTORS (DBR); VERTICAL CAVITY SURFACE EMITTING LASERS (VCSEL);

MIRRORS;

EID: 0030707196     PISSN: 10928669     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)