Characterization of the optical constants of As2Se3 thin films using a fiber optic technique

Infrared Physics and Technology

Volumn 38, Issue 4, 1997, Pages 227-232

  Inci, M N ^a   Yaradanakul, M A ^a   Gulsen G ^a   Aktas G ^a  

^a BOGAZICI UNIVERSITY   (Turkey)

Author keywords

Chalcogenide films; Fiber optics; Optical constants

Indexed keywords

AMORPHOUS FILMS; ANNEALING; BAND STRUCTURE; CHARACTERIZATION; DEPOSITION; FIBER OPTICS; OPACITY; OPTICAL PROPERTIES; OPTICAL VARIABLES MEASUREMENT; REFRACTIVE INDEX; SPECTRUM ANALYSIS; THIN FILMS;

ARSENIUM SELENIDE; CHALCOGENIDE THIN FILMS; OPTICAL BAND GAP; OPTICAL CONSTANTS;

SEMICONDUCTING SELENIUM COMPOUNDS;

EID: 0031168429     PISSN: 13504495     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4495(97)00010-8     Document Type: Article

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