Electron beam induced changes in the refractive index and film thickness of amorphous AsxS100-x and AsxSe100-x films

Journal of Applied Physics

Volumn 84, Issue 11, 1998, Pages 6055-6058

  Nordman, Olli ^a   Nordman, Nina ^a   Peyghambarian, Nasser ^a  

^a UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001698010     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368915     Document Type: Article

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