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Volumn 82, Issue 21, 2003, Pages 3656-3658

Interface structure and chemistry in ZnSe/Ga1-xMnxAs/ZnSe heterostructures

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; EPITAXIAL GROWTH; FERROMAGNETIC MATERIALS; HETEROJUNCTIONS; HIGH RESOLUTION ELECTRON MICROSCOPY; MOLECULAR BEAM EPITAXY; MULTILAYERS; SEMICONDUCTING GALLIUM ARSENIDE; STACKING FAULTS; SUBSTRATES; SURFACE CHEMISTRY; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0037969737     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1577825     Document Type: Article
Times cited : (3)

References (18)
  • 6
    • 0034024368 scopus 로고    scopus 로고
    • T. Walter and D. Certhsen, Ultramicroscopy 81, 279 (2000); K. Ueno, M. Kawayama, Z. R. Dai, A. Koma, and F. S. Ohuchi, J. Cryst. Growth 207, 69 (1999).
    • (2000) Ultramicroscopy , vol.81 , pp. 279
    • Walter, T.1    Certhsen, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.