Total dose and single event effects testing of the Intel Pentium III (P3) and AMD K7 microprocessors

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2001, Pages 38-47

  Howard J W , Jr ^a   Carts, M A ^a   Stattel, R ^a   Rogers, C E ^a   Irwin, T L ^a   Dunsmore, C ^a   Anthony Sciarini, J ^a   LaBel, K A ^a  

^a Jackson and Tull Chartered Engineers   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DOSIMETRY; HEAVY IONS; IONIZING RADIATION; PROTONS;

SINGLE EVENT EFFECTS;

MICROPROCESSOR CHIPS;

EID: 0035162027     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)