Heavy ion transient characterization of a hardened-by-design active pixel sensor array

IEEE Radiation Effects Data Workshop

Volumn 2002-January, Issue , 2002, Pages 187-193

  Marshall, C J ^a   LaBel, K A ^a   Reed, R A ^a   Marshall, P W ^b   Byers, W B ^c   Conger, C ^c   Peden, J ^c   Eid, El Sayed ^d   Jones, M R ^e   Kniffin, S ^e   Gee, G ^f   Pickel, J ^g  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b NASA Department   (United States)

^c SCIENCE APPLICATIONS INTERNATIONAL CORPORATION   (United States)

^d Gentex Corporation   (United States)

^e NORTHROP GRUMMAN CORPORATION   (United States)

^f SGT INC   (United States)

^g PR and T Inc   (United States)

Author keywords

CMOS process; Current measurement; Geometry; Photodiodes; Process design; Radiation hardening; Sensor arrays; Sensor phenomena and characterization; Testing; Transient response

Indexed keywords

CMOS INTEGRATED CIRCUITS; DESIGN; ELECTRIC CURRENT MEASUREMENT; ENERGY TRANSFER; GEOMETRY; HARDENING; HEAVY IONS; PHOTODIODES; PIXELS; PROCESS DESIGN; RADIATION; RADIATION HARDENING; SENSOR ARRAYS; TESTING; TRANSIENT ANALYSIS; TRANSIENTS;

ACTIVE PIXEL SENSOR; ACTIVE PIXEL SENSOR ARRAYS; CMOS PROCESSS; ION INCIDENCE ANGLE; LINEAR ENERGY TRANSFER; RADIATION TOLERANT; SINGLE EVENT TRANSIENTS; TRANSIENT MEASUREMENT;

RADIATION EFFECTS;

EID: 8344262969     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2002.1045552     Document Type: Conference Paper

References (5)

1. El-Sayed Eid, T. Y. Chan, E.R. Fossum, R.H. Tsai, R. Spagnuolo, J. Deily, W.B. Byers, Jr., and J.C. Peden, "Design and characterization of ionizing radiation-tolerant CMOS APS image sensors up to 30 Mrd(Si) total dose," IEEE Trans. Nucl. Sci., Vol. 48, pp. 1796-1806, Dec. 2001.
2. E.R. Fossum, "CMOS image sensors: electronic camera-on-a-chip," IEEE Trans. El. Dev., Vol. 44, pp. 1680-1698, Oct. 1997.
3. G.R. Hopkinson, "Radiation effects in a CMOS active pixel sensor," IEEE Trans. Nucl. Sci., Vol. 47, pp. 2480-2484, Dec. 2000.
4. J.C. Pickel, R. Reed, R. Ladbury, B. Rauscher, P. Marshall, T. Jordan, B. Fodness and G. Gee, "Modeling radiation-induced transients in the Next Generation Space Telescope (NGST)," presentation at the 2002 IEEE Aerospace Conference, Big Sky MT, March 2002.
5. J.C. Pickel, R. Reed, R. Ladbury, B. Rauscher, P. Marshall, T. Jordan, B. Fodness and G. Gee, "Radiation-induced collection charge in infrared arrays," to be presented at the 2002 IEEE NSREC, Phoenix, AZ, July 2002.