Characterization of amorphous Ta2O5 film as a novel anode material

Journal of the Electrochemical Society

Volumn 150, Issue 6, 2003, Pages

  Fu, Zheng Wen ^a   Huang, Feng ^a   Chu, Yan Qiu ^a   Zhang, Ye ^a   Qin, Qi Zong ^a  

^a FUDAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; ELECTRON DIFFRACTION; ENERGY DISPERSIVE SPECTROSCOPY; FILM PREPARATION; LITHIUM BATTERIES; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; SECONDARY BATTERIES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

INDIUM TIN OXIDE; SELECTED AREA ELECTRON DIFFRACTION; TANTALUM OXIDE;

TANTALUM COMPOUNDS;

EID: 0037870472     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1573194     Document Type: Article

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