메뉴 건너뛰기




Volumn 50, Issue 4, 2003, Pages 1094-1102

Compact distributed RLC interconnect models - Part IV: Unified models for time delay, crosstalk, and repeater insertion

Author keywords

Crosstalk; Delay effects; Inductance; Interconnections; Repeaters; RLC circuits; Time domain analysis; Transmission line theory

Indexed keywords

CAPACITANCE; CROSSTALK; ELECTRIC LOADS; INDUCTANCE; TELECOMMUNICATION REPEATERS; TIME DOMAIN ANALYSIS; TRANSMISSION LINE THEORY;

EID: 0037818361     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2003.812509     Document Type: Article
Times cited : (84)

References (9)
  • 1
    • 0034317044 scopus 로고    scopus 로고
    • Compact distributed RLC interconnect models - Part I: Single line transient, time delay and overshoot expressions
    • Nov.
    • J. A. Davis and J. D. Meindl, "Compact distributed RLC interconnect models - Part I: Single line transient, time delay and overshoot expressions," IEEE Trans. Electron Devices, vol. 47, pp. 2068-2077, Nov. 2000.
    • (2000) IEEE Trans. Electron Devices , vol.47 , pp. 2068-2077
    • Davis, J.A.1    Meindl, J.D.2
  • 2
    • 0034315408 scopus 로고    scopus 로고
    • Compact distributed RLC interconnect models - Part II: Coupled line transient expressions and peak crosstalk in multilevel interconnect networks
    • Nov.
    • _, "Compact distributed RLC interconnect models - Part II: Coupled line transient expressions and peak crosstalk in multilevel interconnect networks," IEEE Trans. Electron Devices, vol. 47, pp. 2078-2087, Nov. 2000.
    • (2000) IEEE Trans. Electron Devices , vol.47 , pp. 2078-2087
  • 3
    • 0038494623 scopus 로고    scopus 로고
    • Compact distributed RLC interconnect models -Part III: Transients in single and coupled lines with capacitive load termination
    • Apr.
    • R. Venkatesan, J. A. Davis, and J. D. Meindl, "Compact distributed RLC interconnect models -Part III: Transients in single and coupled lines with capacitive load termination," IEEE Trans. Electron Devices, vol. 50, pp. 1081-1093, Apr. 2003.
    • (2003) IEEE Trans. Electron Devices , vol.50 , pp. 1081-1093
    • Venkatesan, R.1    Davis, J.A.2    Meindl, J.D.3
  • 4
    • 0027222295 scopus 로고
    • Closed form expressions for interconnection delay, coupling and crosstalk in VLSI's
    • Jan.
    • T. Sakurai, "Closed form expressions for interconnection delay, coupling and crosstalk in VLSI's," IEEE Trans. Electron Devices, vol. 40, pp. 118-124,Jan. 1993.
    • (1993) IEEE Trans. Electron Devices , vol.40 , pp. 118-124
    • Sakurai, T.1
  • 5
    • 0033891230 scopus 로고    scopus 로고
    • Effects of inductance on the propagation delay and repeater insertion in VLSI circuits
    • Apr.
    • Y. I. Ismail and E. G. Friedman, "Effects of inductance on the propagation delay and repeater insertion in VLSI circuits," IEEE Trans. VLSI Syst., vol. 8. pp. 195-206, Apr. 2000.
    • (2000) IEEE Trans. VLSI Syst. , vol.8 , pp. 195-206
    • Ismail, Y.I.1    Friedman, E.G.2
  • 8
    • 0034449490 scopus 로고    scopus 로고
    • A new analytical delay and noise model for on-chip RLC interconnect
    • San Francisco, CA
    • Y. Cao, X. Huang, D. Sylvester, N. Chang, and C. Hu, "A new analytical delay and noise model for on-chip RLC interconnect." in IEDM Tech. Dig., San Francisco, CA, 2000, pp. 823-826.
    • (2000) IEDM Tech. Dig. , pp. 823-826
    • Cao, Y.1    Huang, X.2    Sylvester, D.3    Chang, N.4    Hu, C.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.