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Volumn 80, Issue 12, 2002, Pages 1481-1501

Precise atomic lifetime measurements with stored ion beams and ion traps

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Indexed keywords


EID: 0037718175     PISSN: 00084204     EISSN: None     Source Type: Journal    
DOI: 10.1139/p02-123     Document Type: Review
Times cited : (43)

References (115)
  • 18
    • 0003979343 scopus 로고
    • Oxford University Press, Oxford
    • P.K. Ghosh. Ion traps. Oxford University Press, Oxford. 1995.
    • (1995) Ion Traps.
    • Ghosh, P.K.1
  • 39
    • 28044434832 scopus 로고
    • Ph.D. thesis. Aarhus, Denmark
    • H.T. Schmidt. Ph.D. thesis. Aarhus, Denmark. 1994.
    • (1994)
    • Schmidt, H.T.1
  • 84
    • 28044443626 scopus 로고
    • Ph.D. thesis. Columbia University, New York
    • C.D. Lin. Ph.D. thesis. Columbia University, New York. 1975.
    • (1975)
    • Lin, C.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.