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Volumn 62, Issue 2-3, 2000, Pages 141-144

Improved Electron-Beam Ion-Trap Lifetime Measurement of the 1s2s 3S1 Level in N5+ and F7+

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[No Author keywords available]

Indexed keywords


EID: 0000769396     PISSN: 00318949     EISSN: None     Source Type: Journal    
DOI: 10.1238/Physica.Regular.062a00141     Document Type: Article
Times cited : (16)

References (20)
  • 10
    • 0345942361 scopus 로고
    • Ph.D. Thesis, Columbia University
    • Lin, C.D., Ph.D. Thesis, Columbia University, 1975.
    • (1975)
    • Lin, C.D.1
  • 13
    • 0346573537 scopus 로고
    • PhD thesis, Aarhus
    • Schmidt, H. T., PhD thesis, Aarhus 1994.
    • (1994)
    • Schmidt, H.T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.