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Volumn 60, Issue 3, 1999, Pages 2034-2038
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Improved electron-beam ion-trap lifetime measurement of the [Formula Presented] level
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001234534
PISSN: 10502947
EISSN: 10941622
Source Type: Journal
DOI: 10.1103/PhysRevA.60.2034 Document Type: Article |
Times cited : (42)
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References (20)
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