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Volumn 59, Issue 1, 1999, Pages 267-270

Lifetime measurement of [Formula Presented] using an electrostatic ion trap

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EID: 0001442676     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.59.267     Document Type: Article
Times cited : (56)

References (21)
  • 10
    • 85037179672 scopus 로고    scopus 로고
    • R. Novick and D. Weinflash, in Proceedings of the International Conference on Precision and Fundamental Constants, edited by D. N. Langenberg and N. N. Taylor, Natl. Bur. Stand. (U.S.) Spec. Publ. No. 343 (U.S. GPO, Washington, D.C., 1970), p. 403
    • R. Novick and D. Weinflash, in Proceedings of the International Conference on Precision and Fundamental Constants, edited by D. N. Langenberg and N. N. Taylor, Natl. Bur. Stand. (U.S.) Spec. Publ. No. 343 (U.S. GPO, Washington, D.C., 1970), p. 403.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.