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Volumn 59, Issue 1, 1999, Pages 267-270
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Lifetime measurement of [Formula Presented] using an electrostatic ion trap
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001442676
PISSN: 10502947
EISSN: 10941622
Source Type: Journal
DOI: 10.1103/PhysRevA.59.267 Document Type: Article |
Times cited : (56)
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References (21)
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