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Volumn 197, Issue 1, 2003, Pages 168-174

Interface investigation of iron and cobalt metallized porous silicon: AES and FTIR analyses

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; AUGER ELECTRON SPECTROSCOPY; COBALT; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INTERFACES (MATERIALS); IRON; MORPHOLOGY; ORGANIC ACIDS; OXIDATION; POROSITY; SCANNING ELECTRON MICROSCOPY; SOLUTIONS;

EID: 0037701283     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssa.200306494     Document Type: Conference Paper
Times cited : (31)

References (20)
  • 1
    • 0004140205 scopus 로고    scopus 로고
    • Properties of porous silicon
    • INSPEC, IEE (London)
    • L. Canham, "Properties of Porous Silicon", INSPEC, IEE (London, 1997).
    • (1997)
    • Canham, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.