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Applied Surface Science

Volumn 102, Issue , 1996, Pages 169-172

Optical properties of β-FeSi2 films grown on Si substrates with different degree of structural perfection

(6) Lange, H a Henrion, W a Selle, B a Reinsperger, G U a Oertel, G a Von Kanel H b

a HAHN MEITNER INSTITUT (Germany)

b ETH ZURICH (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; ELLIPSOMETRY; ENERGY GAP; FILM GROWTH; IRON COMPOUNDS; LIGHT REFLECTION; MOLECULAR BEAM EPITAXY; OPACITY; PHONONS; SEMICONDUCTING SILICON COMPOUNDS; THIN FILMS;

NEAR INFRARED REFLECTION; PHONON SPECTRA; PHOTON ENERGIES; ULTRAVIOLET REFLECTION;

SEMICONDUCTING FILMS;

EID: 0030564863 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/0169-4332(96)00041-4 Document Type: Article

Times cited : (17)

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