SCOPUS 정보 검색 플랫폼

Materials Science Forum

Volumn 426-432, Issue 3, 2003, Pages 2345-2350

Voltage criterion for electrostatic detachment of a microparticle from a micromanipulated probe

(4) Saito, Shigeki a Himeno, Hideo a Takahashi, Kunio a Onzawa, Tadao a

a TOKYO INSTITUTE OF TECHNOLOGY (Japan)

Author keywords

Adhering particle; Electrostatic detachment; Experiment; Micro manipulation; Voltage

Indexed keywords

BOUNDARY ELEMENT METHOD; ELECTRIC POTENTIAL; GRAVITATIONAL EFFECTS; MATHEMATICAL MODELS; MICROELECTROMECHANICAL DEVICES;

ELECTROSTATIC DETACHMENT;

MICROMANIPULATORS;

EID: 0037663293 PISSN: 02555476 EISSN: 16629752 Source Type: Book Series
DOI: 10.4028/www.scientific.net/msf.426-432.2345 Document Type: Conference Paper

Times cited : (1)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.