IRSE study on effect of thermal curing on the chemistry and thickness of organosilane films coated on aluminium

Applied Surface Science

Volumn 211, Issue 1-4, 2003, Pages 259-269

  Franquet, A ^a   Terryn, H ^a   Vereecken, J ^a  

^a VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

Aluminium; Chemistry; Curing; Infra red spectroscopic ellipsometry; Organosilane; Thickness

Indexed keywords

ALUMINUM ALLOYS; CURING; ELLIPSOMETRY; INFRARED SPECTROSCOPY; REFRACTIVE INDEX; SILANES;

THERMAL CURING;

THIN FILMS;

EID: 0037657463     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(03)00258-7     Document Type: Article

References (46)

1. Hinton R.W. Metal Finishing. 89:1991;55.
2. Sehmbhi T.S., Barnes C., Ward J.J.B. Trans IMF. 62(2):1984;55.
3. M. Stratman, M. Rohwerder, C. Reinaertz, C. Jung, C. Bram, in: Proceedings of the ECASIA, Göteborg, Sweden, Ed. Briggs, 1997, p. 13.
4. W.A. Rowland, Lecture Note of Aluminium Leerstoel 1997/1998, 25 March, Brussels, Belgium, 1998.
5. Rowland W.A., Kresse J. ATB Metallurgie. 37(2-4):1997;89.
6. T. Schram, P. Laha, H. Terryn, ATB Metallurgie 40 (3/4) (2000) Schram T., Laha P., Terryn H. ATB Metallurgie. 41(1/2):2001;572.
7. T. Schram, P. Laha, H. Terryn, ATB Metallurgie 40 (3/4) (2000) Schram T., Laha P., Terryn H. ATB Metallurgie. 41(1/2):2001;572.
8. H. Terryn, Lecture Note of Aluminium Leerstoel 1997/1998, 25 March, Brussels, Belgium, 1998.
9. Schram T., Goeminne G., Terryn H., Vanhoolst W., Van Espen P. Trans IMF. 73(3):1995;91.
10. Petrunin M.A., Nazarov A.P., Mikhailovski Y.N. J. Electrochem. Soc. 143:1996;251.
11. Beccaria A.M., Chiarttini L. Corros. Sci. 41:1999;885.
12. van Ooij W.J., Zhu D. Corrosion. 57(5):2001;413.
13. Beccaria A.M., Bertolotto C. Electrochim. Acta. 42:1997;1361.
14. Tremont R., De Jesus-Cardona H., Garcia-Orozco J., Castro R.J., Cabrera C.R. J. Appl. Electrochem. 30:2000;737.
15. Subramanian V., van Ooij W.J. Corrosion. 54:1998;204.
16. van Ooij W.J., Sabata A. Surf. Interface Anal. 20:1993;475.
17. F. Zucchi, G. Trabanelli, V. Grassi, A. Frignani, in: Proceedings of the Eurocorr01, Associazione Italiana di Metallurgia, 2001.
18. M.J. Collie (Ed.), Corrosion Inhibitors Development Since 1980, Noyes, Park Ridge, NJ, 1983.
19. E. Plueddemann, Silane Coupling Agents, 2nd ed., Plenum Press, New York, 1990.
20. Subramanian V., van Ooij W.J. Surf. Eng. 15:1999;168.
21. Franquet A., Terryn H., Bertrand P., Vereecken J. Surf. Interface Anal. 34:2002;25.
22. A. Franquet, C. Le Pen, H. Terryn, J. Vereecken, Electrochim. Acta (2002).
23. Canillas A., Pascual E., Drevillon B. Thin Solid Films. 134:1993;318.
24. Heitz T., Drevillon B. Thin Solid Films. 313/314:1998;704.
25. A. Franquet, Ph.D. thesis, Vrije Universiteit Brussel, Brussels, Belgium, 2002.
26. Franquet A., De Laet J., Schram T., Terryn H., Subramanian V., van Ooij W.J., Vereecken J. Thin Solid Films. 384:2001;37.
27. H.G. Tompkins, W.A. McGahan, Spectroscopic Ellipsometry and Reflectometry, Wiley, Canada, 1999.
28. E.A. Irene, J.A. Woollam, MRS Bull. (1995) 24.
29. G. Socrates, Infrared Characteristic Group Frequencies: Tables and Charts, 2nd ed., Wiley, New York, 1994.
30. B. Schrader, in: B. Schrader (Ed.), Infrared and Raman Spectroscopy: Methods and Applications, VCH Verlagsgesellschaft mbH, Federal Republic of Germany, 1995.
31. P.J. Launer, in: B. Arkles, et al. (Eds.), Infrared Analysis of Organosilicon Compounds: Spectra-Structure Correlations, Silicon Compounds and Review, Petrach Systems, 1987.
32. De Laet J., Vanhellemont J., Terryn H., Vereecken J. Appl. Phys. A. 54:1992;72.
33. De Laet J., Terryn H., Vereecken J., Vanhellemont J. Surf. Interface Anal. 19:1992;445.
34. D.Y. Smith, E. Shiles, M. Inokuti, The optical properties of metallic aluminium, in: E.D. Palik (Ed.), Handbook of Optical Constants of Solids, vol. 1, Academic Press, San Diego, 1998, p. 369.
35. Jellison G.E. Jr. Thin Solid Films. 234:1993;416.
36. Rossow U. Thin Solid Films. 313/314:1996;97.
37. Schram T., Franquet A., Terryn H., Vereecken J. Adv. Eng. Mater. 1(1):1999;63.
38. T. Schram, Ph.D. thesis, Vrije Universiteit Brussel, Brussels, Belgium, 1999.
39. Bungay C.L., Tiwald T.E., Thompson D.W., De Vries M.J., Woollam J.A., Elman J.F. Thin Solid Films. 313/314:1998;713.
40. Jellison G.E. Jr. Thin Solid Films. 290/291:1996;40.
41. Chatelet J., Claassen H.H., Gruen D.M., Sheft I., Wright R.B. Appl. Spectrosc. 29:1975;185.
42. Fondeur F., Koenig J.L. J. Adhesion. 40:1993;189.
43. Chu Y.T., Bates J.B., White C.W., Farlow G.C. J. Appl. Phys. 64(7):1988;3727.
44. Nishikida K., Hannah R.W. Appl. Spectrosc. 46(6):1992;999.
45. E. Hecht, Optics, 3rd ed., Addison-Wesley, Reading, MA, 1998.
46. Schram T., Terryn H. J. Electrochem. Soc. 148(2):2001;F12.