Spectroscopic ellipsometry: A non-destructive technique for surface analysis

Advanced Engineering Materials

Volumn 1, Issue 1, 1999, Pages 63-66

  Schram, Tom ^a   Franquet, Alexis ^a   Terryn, Herman ^a   Vereecken, Jean ^a  

^a VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033196139     PISSN: 14381656     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1527-2648(199909)1:1<63::AID-ADEM63>3.0.CO;2-1     Document Type: Article

References (10)

1. K. Veddam, Thin Solid Films, 1998, 313-314, 1.
2. A. Röseler, Infrared Spectroscopic Ellipsometry, Akademie-Verlag, Berlin, 1990.
3. G. E. Jellison Jr., Thin Solid Films, 1993, 234, 416.
4. J. De Laet, J. Vanhellemont, H. Terryn, J. Vereecken, Appl. Phys. A, 1992, 54, 72.
5. J. De Laet, H. Terryn, J. Vereecken, J. Vanhellemont, Surf. Interf. Anal., 1992, 19, 445.
6. T. Schram, J. De Laet, H. Terryn, Thin Solid Films, 1998, 313-314, 727.
7. T. Schram, J. De Laet, H. Terryn, J. Electrochem. Soc., 1998, 145, 2733.
8. A. Franquet, V. Subramanian, H. Terryn, W. Van Ooij, J. Vereecken, Formation and protection of silane coatings on aluminium, The European Corrosion Congress, 28.09-1.10.98, Utrecht, The Netherlands, Coatings 11, CD Rom.
9. D. A. G. Bruggeman, Ann. Phys., 1935, 5, 636.
10. A. Röseler, E. H. Korte, Thin Solid Films, 1998, 313-314, 708.