Investigation of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin films

Journal of Applied Physics

Volumn 93, Issue 10 3, 2003, Pages 8725-8727

  Sun, C J ^a,b   Chow, G M ^a   Wang, J P ^b,d   Soo, E W ^b   Je, J H ^c  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b DATA STORAGE INSTITUTE   (Singapore)

^c Pohang University of Science and Technology (POSTECH)   (South Korea)

^d UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COERCIVE FORCE; CRYSTALLOGRAPHY; MAGNETIC RECORDING; SPUTTERING; SURFACE ROUGHNESS; TEXTURES; TRANSMISSION ELECTRON MICROSCOPY; X RAY SCATTERING;

SPUTTERING PRESSURE;

MAGNETIC THIN FILMS;

EID: 0037639969     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1540133     Document Type: Conference Paper

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