Long-range order and short-range order study on CoCrPt/Ti films by synchrotron x-ray scattering and extended x-ray absorption fine structure spectroscopy

Journal of Applied Physics

Volumn 91, Issue 10 I, 2002, Pages 7182-7184

  Sun, C J ^a,b   Chow, G M ^a   Wang, J P ^b   Soo, E W ^b   Hwu, Y K ^c   Je, J H ^d   Cho, T S ^e   Lee, H H ^f   Noh, D Y ^f  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b DATA STORAGE INSTITUTE   (Singapore)

^c INSTITUTE OF PHYSICS   (Taiwan)

^d Pohang University of Science and Technology (POSTECH)   (South Korea)

^e Kyungpook National University   (South Korea)

^f Gwangju Institute of Science and Technology (GIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC ENVIRONMENT; CRYSTALLINITIES; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; LONG RANGE ORDERS; MAGNETIC MEDIA; OUT-OF-PLANE COERCIVITY; PERPENDICULAR MEDIA; PHASE SEGREGATIONS; SEED LAYER; SHORT RANGE ORDERS; SHORT-RANGE ORDER; SYNCHROTRON X-RAY SCATTERING; UNDERLAYER THICKNESS; UNDERLAYERS;

CHROMIUM; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; MAGNETIC PROPERTIES; PLATINUM; X RAY SCATTERING;

X RAYS;

EID: 0037094643     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1448799     Document Type: Article

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